Abstract

The error-related negativity (ERN) is a maximum negative deflection which reliably follows an erroneous response and peaks approximately 50-150ms postresponse over fronto-central scalp and Pe is a slow positive wave which peaks approximately 150-500ms postresponse over centroparietal scalp. Affective distress such as traits of anxiety has been demonstrated to influence the error processing in both clinical and nonclinical groups. Neuroticism refers to the tendency to experience negative emotions (e.g., anxiety). Negative affect has been shown to modulate ERN amplitude: high score group of negative affect displayed larger ERN amplitudes compared to low score group of negative affect. In the present study, we examined how the effects of induced short-term effects on error processing depend on neuroticism.