Abstract

Zirconium oxide doped with Hafnium oxide were prepared by hydrothermal method and characterized by using X-ray diffractometer, morphological studies are studied by using Scanning Electron Microscopy and CV studies and its parameters value were reported here. XRD is good agreement with the JCPDS file no: 06-0318 and its size was nearly 58 nm. The calculated lattice parameter values were well matched with this file number. Cube shaped size of the annealed sample was observed by scanning electron microscopy. CV studies inferred that with increasing of the photocurrent at higher voltage, the current increases.